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Reliability analysis of amorphous silicon thin-film transistors during accelerated ESD stress
Jung Ruey Tsai, Ting Ting Wen, Shao Ming Yang, Gene Sheu, Ruey Dar Chang, Yi Jhen Syu, Chin Ping Liu, Hsiu Fu Chang, Zhao Hui Wei
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review