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Reliability analysis of amorphous silicon thin-film transistors during accelerated ESD stress

  • Jung Ruey Tsai
  • , Ting Ting Wen
  • , Shao Ming Yang
  • , Gene Sheu
  • , Ruey Dar Chang
  • , Yi Jhen Syu
  • , Chin Ping Liu
  • , Hsiu Fu Chang
  • , Zhao Hui Wei

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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