Abstract
An integrated-circuit reliability simulator has been developed. Model parameters for the reliability simulation are obtained through accelerated tests on specially designed test structures. The design of several test chips and associated experimental results are presented. Reliability simulations are described at the detailed circuit-design level using the SPICE circuit simulator or its derivatives as the key module. A computer-automated characterization system is necessary to extract parameter values for the new degradation models.
| Original language | English |
|---|---|
| Pages (from-to) | 381-388 |
| Number of pages | 8 |
| Journal | Proceedings of the Annual Reliability and Maintainability Symposium |
| State | Published - 1990 |
| Externally published | Yes |
| Event | 1990 Proceedings - Annual Reliability and Maintainability Symposium - Los Angeles, CA, USA Duration: 23 01 1990 → 25 01 1990 |