Reliability evaluation and redesign methodology for RFCMOS transceiver frontend circuits in sub-6-GHz band of fifth-generation new radio communication based on the reliability model

Chun Ting Hsieh, Shang Hsien Wang, Chun Wei Yeh, Wei Cheng Lin*

*Corresponding author for this work

Research output: Contribution to journal › Journal Article › peer-review

4 Scopus citations

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