Reliability evaluation and redesign methodology for RFCMOS transceiver frontend circuits in sub-6-GHz band of fifth-generation new radio communication based on the reliability model
- Chun Ting Hsieh
- , Shang Hsien Wang
- , Chun Wei Yeh
- , Wei Cheng Lin*
*Corresponding author for this work
- Chang Gung University
Research output: Contribution to journal › Journal Article › peer-review
4
Scopus
citations