TY - GEN
T1 - Reliability evaluation of 5.2GHz CMOS receiver
AU - Lin, Wei Cheng
AU - King, Ya Chin
PY - 2005
Y1 - 2005
N2 - A receiver's reliability evaluation in relation to its circuit block degradation is investigated with our previously proposed device degradation sub-circuit model. The receiver's performances are analyzed using both the analog parameters and digital parameters. The analog signal and digital signal degradation are monitored through two Figure of Merits parameters, SFDR and EVM, respectively. This work suggests that the hot-carrier induced LNA degradation leads to the SFDR degradation, meanwhile, causing EVM to decrease significantly. The VCO performance degradation results in minor impact on SFDR, but strong effects on the EVM.
AB - A receiver's reliability evaluation in relation to its circuit block degradation is investigated with our previously proposed device degradation sub-circuit model. The receiver's performances are analyzed using both the analog parameters and digital parameters. The analog signal and digital signal degradation are monitored through two Figure of Merits parameters, SFDR and EVM, respectively. This work suggests that the hot-carrier induced LNA degradation leads to the SFDR degradation, meanwhile, causing EVM to decrease significantly. The VCO performance degradation results in minor impact on SFDR, but strong effects on the EVM.
UR - https://www.scopus.com/pages/publications/33847118659
U2 - 10.1109/EUMC.2005.1610035
DO - 10.1109/EUMC.2005.1610035
M3 - 会议稿件
AN - SCOPUS:33847118659
SN - 2960055128
SN - 9782960055122
T3 - 35th European Microwave Conference 2005 - Conference Proceedings
SP - 753
EP - 756
BT - 35th European Microwave Conference 2005 - Conference Proceedings
T2 - 2005 European Microwave Conference
Y2 - 4 October 2005 through 6 October 2005
ER -