Reliability evaluation of voltage controlled oscillators based on a device degradation sub-circuit model

Wei Cheng Lin; Long Jei Du; Ya Chin King

Reliability evaluation of voltage controlled oscillators based on a device degradation sub-circuit model

Wei Cheng Lin^*
, Long Jei Du
, Ya Chin King

^*Corresponding author for this work

National Tsing Hua University

Research output: Contribution to conference › Conference Paper › peer-review

6 Scopus citations

Abstract

This paper presents a method for circuit reliability evaluation. Based on the study of device reliability, a sub-circuit describing the device degradation after high-voltage stress is proposed. This model allows circuit reliability of VCOs to be evaluated and provides higher degree of freedom for circuit designers.

Original language	English
Pages	377-380
Number of pages	4
State	Published - 2003
Externally published	Yes
Event	2003 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Philadelphia, PA, United States Duration: 08 06 2003 → 10 06 2003

Conference

Conference	2003 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium
Country/Territory	United States
City	Philadelphia, PA
Period	08/06/03 → 10/06/03

Cite this

@conference{4dff26139fb4490eba21c829b7ba01de,

title = "Reliability evaluation of voltage controlled oscillators based on a device degradation sub-circuit model",

abstract = "This paper presents a method for circuit reliability evaluation. Based on the study of device reliability, a sub-circuit describing the device degradation after high-voltage stress is proposed. This model allows circuit reliability of VCOs to be evaluated and provides higher degree of freedom for circuit designers.",

author = "Lin, \{Wei Cheng\} and Du, \{Long Jei\} and King, \{Ya Chin\}",

year = "2003",

language = "英语",

pages = "377--380",

note = "2003 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium ; Conference date: 08-06-2003 Through 10-06-2003",

}

TY - CONF

T1 - Reliability evaluation of voltage controlled oscillators based on a device degradation sub-circuit model

AU - Lin, Wei Cheng

AU - Du, Long Jei

AU - King, Ya Chin

PY - 2003

Y1 - 2003

N2 - This paper presents a method for circuit reliability evaluation. Based on the study of device reliability, a sub-circuit describing the device degradation after high-voltage stress is proposed. This model allows circuit reliability of VCOs to be evaluated and provides higher degree of freedom for circuit designers.

AB - This paper presents a method for circuit reliability evaluation. Based on the study of device reliability, a sub-circuit describing the device degradation after high-voltage stress is proposed. This model allows circuit reliability of VCOs to be evaluated and provides higher degree of freedom for circuit designers.

UR - https://www.scopus.com/pages/publications/0042090165

M3 - 论文

AN - SCOPUS:0042090165

SP - 377

EP - 380

T2 - 2003 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium

Y2 - 8 June 2003 through 10 June 2003

ER -

Reliability evaluation of voltage controlled oscillators based on a device degradation sub-circuit model

Abstract

Conference

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