Reliability Perspective on the IoT and Nanoelectronics

Cher Ming Tan

doi:10.1109/INEC.2018.8441916

Reliability Perspective on the IoT and Nanoelectronics

Cher Ming Tan

Department of Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

Internet of Things (IoT) is coming strongly and we have no escape to it. While current technology and its development can indeed make IoT a reality, its cost has to be much lower and at the same time its reliability must be very high. Furthermore, the necessity of nano-electronics in IoT presents new degradation mechanisms that need to be studied in detail. Thus, it is a huge challenge in reliability field in anticipation of IoT era. This work presents some critical issues and highlight some works that are being done to meet the coming challenges.

Original language	English
Title of host publication	2018 IEEE 8th International Nanoelectronics Conferences, INEC 2018
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1-2
Number of pages	2
ISBN (Print)	9781538642504
DOIs	https://doi.org/10.1109/INEC.2018.8441916
State	Published - 20 08 2018
Event	8th IEEE International Nanoelectronics Conferences, INEC 2018 - Kuala Lumpur, Malaysia Duration: 03 01 2018 → 05 01 2018

Publication series

Name	2018 IEEE 8th International Nanoelectronics Conferences, INEC 2018

Conference

Conference	8th IEEE International Nanoelectronics Conferences, INEC 2018
Country/Territory	Malaysia
City	Kuala Lumpur
Period	03/01/18 → 05/01/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Keywords

Radiation
electromagnetics
electromigration
new failure mechanisms

Access to Document

10.1109/INEC.2018.8441916

Cite this

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title = "Reliability Perspective on the IoT and Nanoelectronics",

abstract = "Internet of Things (IoT) is coming strongly and we have no escape to it. While current technology and its development can indeed make IoT a reality, its cost has to be much lower and at the same time its reliability must be very high. Furthermore, the necessity of nano-electronics in IoT presents new degradation mechanisms that need to be studied in detail. Thus, it is a huge challenge in reliability field in anticipation of IoT era. This work presents some critical issues and highlight some works that are being done to meet the coming challenges.",

keywords = "Radiation, electromagnetics, electromigration, new failure mechanisms",

author = "Tan, {Cher Ming}",

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Tan, CM 2018, Reliability Perspective on the IoT and Nanoelectronics. in 2018 IEEE 8th International Nanoelectronics Conferences, INEC 2018., 8441916, 2018 IEEE 8th International Nanoelectronics Conferences, INEC 2018, Institute of Electrical and Electronics Engineers Inc., pp. 1-2, 8th IEEE International Nanoelectronics Conferences, INEC 2018, Kuala Lumpur, Malaysia, 03/01/18. https://doi.org/10.1109/INEC.2018.8441916

Reliability Perspective on the IoT and Nanoelectronics. / Tan, Cher Ming.
2018 IEEE 8th International Nanoelectronics Conferences, INEC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. p. 1-2 8441916 (2018 IEEE 8th International Nanoelectronics Conferences, INEC 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - Internet of Things (IoT) is coming strongly and we have no escape to it. While current technology and its development can indeed make IoT a reality, its cost has to be much lower and at the same time its reliability must be very high. Furthermore, the necessity of nano-electronics in IoT presents new degradation mechanisms that need to be studied in detail. Thus, it is a huge challenge in reliability field in anticipation of IoT era. This work presents some critical issues and highlight some works that are being done to meet the coming challenges.

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KW - electromagnetics

KW - electromigration

KW - new failure mechanisms

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PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 8th IEEE International Nanoelectronics Conferences, INEC 2018

Y2 - 3 January 2018 through 5 January 2018

ER -

Reliability Perspective on the IoT and Nanoelectronics

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Publication series

Conference

Bibliographical note

Keywords

Access to Document

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