Abstract
Reliability of individual power diode in automotive electronic systems is crucial. However, present reliability test can be performed only on sampling basis due to its destructiveness. On the other hand, present ΔV F test cannot fully screen out the weak reliability power diode. In this work, the root cause of the thermal/power cycle reliability test of power diode is identified, and a new electrical screening test is proposed. This test is non-destructive, and it combines the ΔV F test and the new series resistance test. The series resistance test takes less than 10 ms for each diode, making it possible for 100% screening. Experimental results show that this new screening test can indeed screen out the weak reliability diode effectively and improve its reliability by more than 10 folds.
| Original language | English |
|---|---|
| Pages (from-to) | 1723-1727 |
| Number of pages | 5 |
| Journal | Microelectronics Reliability |
| Volume | 45 |
| Issue number | 9-11 |
| DOIs | |
| State | Published - 09 2005 |
| Externally published | Yes |
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