Reliability studies on AlGaN/GaN metal-insulator-semiconductor high-electron-mobility transistors with through-substrate via technique and backside heat sink metal on silicon-on-insulator substrates
Kuang Po Hsueh, Hou Yu Wang, Hsiang Chun Wang, Hsuan Ling Kao, Feng Tso Chien, Chih Tien Chen, Kuo Jen Chang, Hsien Chin Chiu*
Research output: Contribution to journal › Journal Article › peer-review
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