Reliability study of LED driver - A case study of black box testing

Song Lan*, Cher Ming Tan, Kevin Wu

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

25 Scopus citations

Abstract

A method to evaluate the reliability of the Integrated Circuit without knowing the details of the internal circuit is developed. This method is called Pseudo Black Box testing because the basic knowledge of circuit theory is needed. In this paper, this black box testing is applied to the reliability study of a commercial LED driver and the circuit degradation model is built. The possible failure mechanisms of the LED driver are proposed and verified through failure analysis.

Original languageEnglish
Pages (from-to)1940-1944
Number of pages5
JournalMicroelectronics Reliability
Volume52
Issue number9-10
DOIs
StatePublished - 09 2012
Externally publishedYes

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