Retraction to Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface

Amit Prakash*, Siddheswar Maikap, Hsien Chin Chiu, Ta Chang Tien, Chao Sung Lai

*Corresponding author for this work

Research output: Contribution to journalComment/debate

2 Scopus citations
Original languageEnglish
Article number419
JournalNanoscale Research Letters
Volume8
Issue number1
DOIs
StatePublished - 2013

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