Robust Cascaded Boost Converter with See-Saw Stress-Relief Control

Chung Yi Li*, Tzu Yu Chen, Deng Fong Lu, Yue Liang Chou, Hung Chi Chen, Shinn Yn Lin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In order to enable the excellent reliability in boost converter with high voltage conversion ratio, we proposed cascade topology with seesaw stress relief control to reduce stress of power MOS. The proposed robust cascaded boost converter (CBC) only needs 68% duty ratio instead of 90% in conventional one. The proposed seesaw control strategy to make the first-stage maximum current with low voltage, but the second-stage maximum voltage with low current. The proposed see-saw stress relief method lowers the conduction loss and increase the reliability in the application of high voltage conversion ratio. Simulation and experiment results validate the effectiveness of reducing stress and the heat simultaneously.

Original languageEnglish
Title of host publicationProceedings - International SoC Design Conference 2023, ISOCC 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages179-180
Number of pages2
ISBN (Electronic)9798350327038
DOIs
StatePublished - 2023
Externally publishedYes
Event20th International SoC Design Conference, ISOCC 2023 - Jeju, Korea, Republic of
Duration: 25 10 202328 10 2023

Publication series

NameProceedings - International SoC Design Conference 2023, ISOCC 2023

Conference

Conference20th International SoC Design Conference, ISOCC 2023
Country/TerritoryKorea, Republic of
CityJeju
Period25/10/2328/10/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

Keywords

  • Cascaded boost converter
  • Reliability
  • Stress relief control

Fingerprint

Dive into the research topics of 'Robust Cascaded Boost Converter with See-Saw Stress-Relief Control'. Together they form a unique fingerprint.

Cite this