@conference{59bab1924069446ea88f10feb7c1cd02,
title = "Robust Ultra-violet (UV) Analysis Technique for Band Diagram Extraction of Al/HfGdO/SiO2/p-Si Structure with Different Hf/Gd Dual-sputtered Ratio",
author = "Pai-Chi Chou and Jer-Chyi Wang and Chao-Sung Lai and Jer-Yi Lin and Wei-Cheng Chang and Kuan-Ting Chen and Yung-Chin Chung and Yu-Hsuan Lin and I-Ting Wang and Chih-I Wu and Po-Sheng Wang",
year = "2010",
language = "American English",
note = "Solid State Devices and Materials (SSDM 2010) ; Conference date: 22-09-2010 Through 24-09-2010",
}