Root Cause Analysis of Intermittent Digital System Reset and Its Reliability Evaluation

  • Cher Ming Tan
  • , Steve Wang
  • , Shawn L.H. Huang
  • , Josh M.P. Xiong
  • , Henry Y.H. Luo
  • , Vimal Kant Pandey

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

With the advancement of technology, modern electronic devices have mostly transitioned to using touchscreens instead of physical buttons for their operation, aiming for a more aesthetic and intuitive user experience. However, certain special buttons have been retained despite technological evolution, such as the power button and the reset button. The main reason for preserving the reset button is its crucial importance in certain situations, particularly when a device encounters a malfunction or system anomaly. In some cases, a device may become stuck in a state where it cannot enter the system, rendering the operation through a touchscreen unavailable. In such scenario, only the use of a physical 'reset button' can restore the device back to normal. This work shares a case study from an operator of China railway transportation industry. The customer utilized Moxa's products at their stations to transmit train operation data from the station to the Communication Based Train Control (CBTC). After two years of operation, the customer reported a failed case that the device reset to its factory default settings by itself, resulting in the loss of previously saved system configurations. This work aims to identify the root cause of the reported failure, through the identification of the failure mechanism which is found to be related to silver electrochemical migration. After knowing the failure mechanism, the design of the experiment (DOE) method was also applied to determine the most feasible solution to this failure. Additionally, to assess the risk of the devices installed at the customer's field site, the warranty data analysis was conducted to develop a failure model so as to evaluate its reliability in the field.

Original languageEnglish
Title of host publicationRAMS 2024 - Annual Reliability and Maintainability Symposium, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350307696
ISBN (Print)9798350307696, 9798350307696
DOIs
StatePublished - 2024
Event70th Annual Reliability and Maintainability Symposium, RAMS 2024 - Albuquerque, United States
Duration: 22 01 202425 01 2024

Publication series

NameProceedings - Annual Reliability and Maintainability Symposium
ISSN (Print)0149-144X

Conference

Conference70th Annual Reliability and Maintainability Symposium, RAMS 2024
Country/TerritoryUnited States
CityAlbuquerque
Period22/01/2425/01/24

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

Keywords

  • factory reset
  • silver electrochemical migration
  • soldering flux
  • Tactile switch

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