Scatter fraction performance tests for positron imaging system with dual plane geometry

Yu Ching Ni*, Tien Hsiu Tsai, Meei Ling Jan, Zhi Kun Lin, Fan Pin Tseng, Shiang Lin Hsu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

NEMA NU 2 and IEC 61675-1 standards are widely used for characterizing the performance of PET scanners. These documents specify procedures for acquiring and analyzing data by using standard phantoms and radio-sources. However, some dedicated PET systems, such as breast and prostate PET systems, have non-ring geometric design may not meet these standards. In this work, we proposed certain modifications to the NEMA NU 2 for analyzing the scatter fraction (SF) of a dual-plane positron imaging system reasonably. A projection-map with geometric compensation was performed instead of sinogram to get analyzed profile. Three methods to determine analyzed window (4 FWHM, 40 mm width, and 14 mm width) were used to estimate SF. The effects of diameter and location of line source were also considered. Three diameters (0.6, 2, 3.2 mm) and nine locations of line source were set for GATE simulation. The equivalent SF of the dual-plane system was calculated as the area-weighted average of nine-position SF values. The results reveal that the presented method here can estimate SF value better, compared with the methods suggested by the standards.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
Pages2163-2165
Number of pages3
DOIs
StatePublished - 2010
Externally publishedYes
Event2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 - Knoxville, TN, United States
Duration: 30 10 201006 11 2010

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Conference

Conference2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Country/TerritoryUnited States
CityKnoxville, TN
Period30/10/1006/11/10

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