Selection of failure time within test time interval for group reliability data analysis

Research output: Contribution to conference › Proceeding

Original language	American English
State	Published - 2000
Event	2000 Canadian Conference on Electrical and Computer Engineering - Halifax, NS, Canada Duration: 07 05 2000 → 10 05 2000

Conference	2000 Canadian Conference on Electrical and Computer Engineering
Period	07/05/00 → 10/05/00

Cite this

@conference{53177275d0f646969a7d814a8c58c1d9,

title = "Selection of failure time within test time interval for group reliability data analysis",

author = "Cher-Ming Tan and Guan Zhang",

year = "2000",

language = "American English",

note = "2000 Canadian Conference on Electrical and Computer Engineering ; Conference date: 07-05-2000 Through 10-05-2000",

}