TY - GEN
T1 - Self-powered integrated rectifier for wireless medical energy harvesting applications
AU - Gong, Cihun Siyong Alex
AU - Shiue, Muh Tian
AU - Lee, Yung Pin
AU - Yao, Kai Wen
PY - 2011
Y1 - 2011
N2 - This paper reports on the results of an integrated rectifier for wirelessly powered medical electronic devices. To considerably enhance the rectification efficiency, high-performance active diodes are incorporated. In addition, a fine cost-effective and energy-efficient back telemetry mechanism with increased robustness against physical variations in the external reader and internal transponder (implant) has been equipped. Fabricated in a 0.18-μm technology, the design demonstrates that it is able to achieve maximum conversion efficiency approximately 90%, while at the same time dramatically reducing the overhead to practical implementation. It has also been proved for its full functionality in the asserted built-in robust back telemetry.
AB - This paper reports on the results of an integrated rectifier for wirelessly powered medical electronic devices. To considerably enhance the rectification efficiency, high-performance active diodes are incorporated. In addition, a fine cost-effective and energy-efficient back telemetry mechanism with increased robustness against physical variations in the external reader and internal transponder (implant) has been equipped. Fabricated in a 0.18-μm technology, the design demonstrates that it is able to achieve maximum conversion efficiency approximately 90%, while at the same time dramatically reducing the overhead to practical implementation. It has also been proved for its full functionality in the asserted built-in robust back telemetry.
UR - https://www.scopus.com/pages/publications/79959501707
U2 - 10.1109/VDAT.2011.5783635
DO - 10.1109/VDAT.2011.5783635
M3 - 会议稿件
AN - SCOPUS:79959501707
SN - 9781424484997
T3 - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
SP - 303
EP - 306
BT - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
T2 - 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
Y2 - 25 April 2011 through 28 April 2011
ER -