Simple analytical model for short-channel MOS devices

H. C. Chow*, W. S. Feng, J. B. Kuo

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

6 Scopus citations

Abstract

A simple analytical model derived from a quasi-two-dimensional analysis with a non-vanishing E-field derivative at the pinchoff point and a continuous output conductance at the transition point for short-channel MOSFETs is presented. This model also covers mobility reduction, carrier velocity saturation, body, channel-length modulation, source-drain series resistance and short-channel effects for an accurate determination of the pinchoff point location without internal numerical iterations as compared to other models. This model can be used to describe the channel-length modulation effects more accurately in circuit simulation with short-channel MOSFETs.

Original languageEnglish
Pages (from-to)405-409
Number of pages5
JournalIEE Proceedings, Part G: Circuits, Devices and Systems
Volume139
Issue number3
DOIs
StatePublished - 1992
Externally publishedYes

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