Soft-Event-Upset and Soft-Event-Transient Tolerant CMOS Circuit Design for Low-Voltage Low-Power Wireless IoT Applications

I. Chyn Wey; Chun Han Chen; Si Zhan Fang; Heng Jui Chou

doi:10.1109/ICUFN.2019.8806167

Soft-Event-Upset and Soft-Event-Transient Tolerant CMOS Circuit Design for Low-Voltage Low-Power Wireless IoT Applications

I. Chyn Wey, Chun Han Chen, Si Zhan Fang, Heng Jui Chou

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

In the wireless IoT applications, low power is a critical criteria, and low-voltage is a direct way to meet such demand. However, low-voltage criteria in advanced CMOS VLSI designs will lead to critical design challenges in dealing with soft-error interference, especial while the cascade transistor number is limited under low-voltage operations. Some possible low-voltage SEU-tolerant and SET-tolerant circuit design methods are discussed in this paper, such as robust C-element, Error-Correction with Duplication, dual interlocked storage cell (DICE) latch, and such as feedback redundant SEU-tolerant (FERST) latch designs.

Original language	English
Title of host publication	ICUFN 2019 - 11th International Conference on Ubiquitous and Future Networks
Publisher	IEEE Computer Society
Pages	179-181
Number of pages	3
ISBN (Electronic)	9781728113395
DOIs	https://doi.org/10.1109/ICUFN.2019.8806167
State	Published - 07 2019
Externally published	Yes
Event	11th International Conference on Ubiquitous and Future Networks, ICUFN 2019 - Zagreb, Croatia Duration: 02 07 2019 → 05 07 2019

Publication series

Name	International Conference on Ubiquitous and Future Networks, ICUFN
Volume	2019-July
ISSN (Print)	2165-8528
ISSN (Electronic)	2165-8536

Conference

Conference	11th International Conference on Ubiquitous and Future Networks, ICUFN 2019
Country/Territory	Croatia
City	Zagreb
Period	02/07/19 → 05/07/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

Access to Document

10.1109/ICUFN.2019.8806167

Cite this

Wey, I. C., Chen, C. H., Fang, S. Z., & Chou, H. J. (2019). Soft-Event-Upset and Soft-Event-Transient Tolerant CMOS Circuit Design for Low-Voltage Low-Power Wireless IoT Applications. In ICUFN 2019 - 11th International Conference on Ubiquitous and Future Networks (pp. 179-181). Article 8806167 (International Conference on Ubiquitous and Future Networks, ICUFN; Vol. 2019-July). IEEE Computer Society. https://doi.org/10.1109/ICUFN.2019.8806167

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title = "Soft-Event-Upset and Soft-Event-Transient Tolerant CMOS Circuit Design for Low-Voltage Low-Power Wireless IoT Applications",

abstract = "In the wireless IoT applications, low power is a critical criteria, and low-voltage is a direct way to meet such demand. However, low-voltage criteria in advanced CMOS VLSI designs will lead to critical design challenges in dealing with soft-error interference, especial while the cascade transistor number is limited under low-voltage operations. Some possible low-voltage SEU-tolerant and SET-tolerant circuit design methods are discussed in this paper, such as robust C-element, Error-Correction with Duplication, dual interlocked storage cell (DICE) latch, and such as feedback redundant SEU-tolerant (FERST) latch designs.",

author = "Wey, \{I. Chyn\} and Chen, \{Chun Han\} and Fang, \{Si Zhan\} and Chou, \{Heng Jui\}",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 11th International Conference on Ubiquitous and Future Networks, ICUFN 2019 ; Conference date: 02-07-2019 Through 05-07-2019",

year = "2019",

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doi = "10.1109/ICUFN.2019.8806167",

language = "英语",

series = "International Conference on Ubiquitous and Future Networks, ICUFN",

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Wey, IC, Chen, CH, Fang, SZ & Chou, HJ 2019, Soft-Event-Upset and Soft-Event-Transient Tolerant CMOS Circuit Design for Low-Voltage Low-Power Wireless IoT Applications. in ICUFN 2019 - 11th International Conference on Ubiquitous and Future Networks., 8806167, International Conference on Ubiquitous and Future Networks, ICUFN, vol. 2019-July, IEEE Computer Society, pp. 179-181, 11th International Conference on Ubiquitous and Future Networks, ICUFN 2019, Zagreb, Croatia, 02/07/19. https://doi.org/10.1109/ICUFN.2019.8806167

Soft-Event-Upset and Soft-Event-Transient Tolerant CMOS Circuit Design for Low-Voltage Low-Power Wireless IoT Applications. / Wey, I. Chyn; Chen, Chun Han; Fang, Si Zhan et al.
ICUFN 2019 - 11th International Conference on Ubiquitous and Future Networks. IEEE Computer Society, 2019. p. 179-181 8806167 (International Conference on Ubiquitous and Future Networks, ICUFN; Vol. 2019-July).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - In the wireless IoT applications, low power is a critical criteria, and low-voltage is a direct way to meet such demand. However, low-voltage criteria in advanced CMOS VLSI designs will lead to critical design challenges in dealing with soft-error interference, especial while the cascade transistor number is limited under low-voltage operations. Some possible low-voltage SEU-tolerant and SET-tolerant circuit design methods are discussed in this paper, such as robust C-element, Error-Correction with Duplication, dual interlocked storage cell (DICE) latch, and such as feedback redundant SEU-tolerant (FERST) latch designs.

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Wey IC, Chen CH, Fang SZ, Chou HJ. Soft-Event-Upset and Soft-Event-Transient Tolerant CMOS Circuit Design for Low-Voltage Low-Power Wireless IoT Applications. In ICUFN 2019 - 11th International Conference on Ubiquitous and Future Networks. IEEE Computer Society. 2019. p. 179-181. 8806167. (International Conference on Ubiquitous and Future Networks, ICUFN). doi: 10.1109/ICUFN.2019.8806167

Soft-Event-Upset and Soft-Event-Transient Tolerant CMOS Circuit Design for Low-Voltage Low-Power Wireless IoT Applications

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