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Stability of GaN HEMT Device Under Static and Dynamic Gate Stress
Linfei Gao, Ze Zhong, Qiyan Zhang, Xiaohua Li, Xinbo Xiong, Shaojun Chen, Longkou Chen, Huaibao Yan, Anle Zhang, Jiajun Han, Wenrong Zhuang, Feng Qiu, Hsien Chin Chiu, Shuangwu Huang, Xinke Liu*
*Corresponding author for this work
Research output: Contribution to journal › Journal Article › peer-review