Statistical analysis of multi-censored electromigration data using the EM algorithm

Nagarajan Raghavan; Cher Ming Tan

doi:10.1109/IPFA.2007.4378096

Statistical analysis of multi-censored electromigration data using the EM algorithm

Nagarajan Raghavan^*, Cher Ming Tan

^*Corresponding author for this work

Nanyang Technological University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Original language	English
Title of host publication	Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007
Pages	257-262
Number of pages	6
DOIs	https://doi.org/10.1109/IPFA.2007.4378096
State	Published - 2007
Externally published	Yes
Event	2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India Duration: 11 07 2007 → 13 07 2007

Publication series

Name	Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Conference

Conference	2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits
Country/Territory	India
City	Bangalore
Period	11/07/07 → 13/07/07

Access to Document

10.1109/IPFA.2007.4378096

Cite this

Raghavan, N., & Tan, C. M. (2007). Statistical analysis of multi-censored electromigration data using the EM algorithm. In Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007 (pp. 257-262). Article 4378096 (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA). https://doi.org/10.1109/IPFA.2007.4378096

Raghavan, Nagarajan ; Tan, Cher Ming. / Statistical analysis of multi-censored electromigration data using the EM algorithm. Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007. 2007. pp. 257-262 (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

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title = "Statistical analysis of multi-censored electromigration data using the EM algorithm",

author = "Nagarajan Raghavan and Tan, {Cher Ming}",

year = "2007",

doi = "10.1109/IPFA.2007.4378096",

language = "英语",

isbn = "1424410142",

series = "Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA",

pages = "257--262",

booktitle = "Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007",

note = "2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits ; Conference date: 11-07-2007 Through 13-07-2007",

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Raghavan, N & Tan, CM 2007, Statistical analysis of multi-censored electromigration data using the EM algorithm. in Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007., 4378096, Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, pp. 257-262, 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, Bangalore, India, 11/07/07. https://doi.org/10.1109/IPFA.2007.4378096

Statistical analysis of multi-censored electromigration data using the EM algorithm. / Raghavan, Nagarajan; Tan, Cher Ming.
Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007. 2007. p. 257-262 4378096 (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Raghavan, Nagarajan

AU - Tan, Cher Ming

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M3 - 会议稿件

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T2 - 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits

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Raghavan N, Tan CM. Statistical analysis of multi-censored electromigration data using the EM algorithm. In Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007. 2007. p. 257-262. 4378096. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA). doi: 10.1109/IPFA.2007.4378096

Statistical analysis of multi-censored electromigration data using the EM algorithm

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