| Translated title of the contribution | 65奈米以下CMOS元件應變對可靠性影響的探討 |
|---|---|
| Original language | American English |
| Supervisors/Advisors |
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| State | Published - 2007 |
| Externally published | Yes |
Strained Related Reliability Issues for CMOS Device of 65nm Generation and Beyond
黃大正
Research output: Types of Thesis › Master's thesis