TY - GEN
T1 - Study of humidity reliability of high power LEDs
AU - Tan, Cher Ming
AU - Chen, Boon Khai Eric
AU - Xiong, Meng
PY - 2010
Y1 - 2010
N2 - High power Light-emitting Diode (LED) as Solid-state Lighting (SSL) is a promising light source, and one of the crucial factors for its wide acceptance is its reliability. However, humidity reliability study of the high power LED reliability is rare despite that they are also susceptible to high humidity environments in many of their applications. In this work, we present the various humidity reliability of the high power LEDs, and we found that there are several failure mechanisms that render LED failure under humid conditions. These mechanisms do not cause a sudden black out of the LED, and the mechanisms that cause a continuous degradation of the lumen output are also changing with time. Furthermore, the mechanisms are distinctly different from that for integrated circuit (ICs), and thus the humidity models used for the extrapolation of the lifetime of IC under different humid condition cannot be applied to the high power LEDs, and new model that also account for the changing failure mechanisms must be developed if the time to failure of LED under humid condition is to be predicted as an important reliability index for the LEDs.
AB - High power Light-emitting Diode (LED) as Solid-state Lighting (SSL) is a promising light source, and one of the crucial factors for its wide acceptance is its reliability. However, humidity reliability study of the high power LED reliability is rare despite that they are also susceptible to high humidity environments in many of their applications. In this work, we present the various humidity reliability of the high power LEDs, and we found that there are several failure mechanisms that render LED failure under humid conditions. These mechanisms do not cause a sudden black out of the LED, and the mechanisms that cause a continuous degradation of the lumen output are also changing with time. Furthermore, the mechanisms are distinctly different from that for integrated circuit (ICs), and thus the humidity models used for the extrapolation of the lifetime of IC under different humid condition cannot be applied to the high power LEDs, and new model that also account for the changing failure mechanisms must be developed if the time to failure of LED under humid condition is to be predicted as an important reliability index for the LEDs.
UR - http://www.scopus.com/inward/record.url?scp=78751531062&partnerID=8YFLogxK
U2 - 10.1109/ICSICT.2010.5667441
DO - 10.1109/ICSICT.2010.5667441
M3 - 会议稿件
AN - SCOPUS:78751531062
SN - 9781424457984
T3 - ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings
SP - 1592
EP - 1595
BT - ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings
T2 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology
Y2 - 1 November 2010 through 4 November 2010
ER -