Abstract
A concise analytical expression for switch-induced error voltage on a switched capacitor is derived from the distributed MQSFET model. The result, however, can be interpreted in terms of a simple lumped equivalent circuit. With this expression we explore the dependence of the error voltage on process, switch turnoff rate, source resistance, and other circuit parameters. These results can be used to quickly predict the error voltage. The analytical expression is supported by the close agreement with computer simulations and experiments.
| Original language | English |
|---|---|
| Pages (from-to) | 519-525 |
| Number of pages | 7 |
| Journal | IEEE Journal of Solid-State Circuits |
| Volume | 19 |
| Issue number | 4 |
| DOIs | |
| State | Published - 08 1984 |
| Externally published | Yes |
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