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System matrix based on sensitivity model for small animal multi-pinhole SPECT system

  • Ho Hui Hsieh*
  • , Ching Han Hsu
  • , Greta S.P. Mok
  • , Yu Jung Tsai
  • , Shi Ing Chang
  • , Ing Tsung Hsiao
  • *Corresponding author for this work
  • Chang Gung University
  • National Tsing Hua University
  • Chinese University of Hong Kong
  • Chang Gung Memorial Hospital

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

High spatial resolution of multi-pinhole SPECT is often hampered by physical effects including collimator response, and pinhole edge penetration. The collimator response is related to the blurring effect varying with distance from source to the aperture, and caused by the non-ideal aperture diameter. Pinhole edge penetration is referred to penetration of gamma rays through the thin edge of the collimator, and leads to resolution degradation as well. Thus, to improve resolution, both effects of collimator response and pinhole penetration need to be corrected in the reconstruction. Here, a system model based on an analytical sensitivity model including both aperture response and penetration effect is proposed. The penetration effect is modeled by a penetration mask by re-distributing the analytical sensitivity for an analytical knife-edge multi-pinhole formula to the detector space. The penetration mask is analytically computed by attenuation path length through the aperture. This system model is then implemented into the iterative reconstruction on a stationary multi-pinhole SPECT system based on clinical three-head SPECT system. From the preliminary result, the new system model for iterative stationary mu I ti pinhole SPECT reconstruction showed promising in improving image resolution over the conventional ideal pinhole model for the stationary multipinhole SPECT.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
Pages3308-3311
Number of pages4
DOIs
StatePublished - 2010
Externally publishedYes
Event2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 - Knoxville, TN, United States
Duration: 30 10 201006 11 2010

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Conference

Conference2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Country/TerritoryUnited States
CityKnoxville, TN
Period30/10/1006/11/10

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