Temperature-dependence of noise figure of monolithic RF transformers on a thin (20 μm) silicon substrate

Yo Sheng Lin*, Tao Wang, Shey Shi Lu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, we demonstrate an analysis of the effect of temperature (from -45°C to 175°C) on the quality-factor (Q-factor) and noise figure (NF) performances of monolithic RF transformers on both normal (750 μm) and thin (20 μm) silicon substrates. The results show the silicon substrate thinning is effective in improving the Q-factor and NF performances of transformers. In addition, Q-factors of both primary and secondary coils decrease with increasing temperature but show a reverse behavior within a higher frequency range. Noise figure (NF) increases with increasing temperature. The present analysis enables RF engineers to understand more deeply the NF (i.e. power loss) behavior of RF monolithic transformers fabricated on a silicon substrate, and hence is helpful for them to design less temperature-sensitive low-supply-voltage transformer-feedback low-noise-amplifier (LNA) and voltage-controlled-oscillator (VCO), and other radio-frequency integrated circuits (RF-IC's) which includes transformers.

Original languageEnglish
Title of host publicationProceedings - 2004 IEEE Radio and Wireless Conference, RAWCON
EditorsG. Heiter
Pages103-106
Number of pages4
StatePublished - 2004
Externally publishedYes
EventProceedings - 2004 IEEE Radio and Wireless Conference, RAWCON - Atlanta, GA, United States
Duration: 19 09 200422 09 2004

Publication series

NameProceedings - 2004 IEEE Radio and Wireless Conference, RAWCON

Conference

ConferenceProceedings - 2004 IEEE Radio and Wireless Conference, RAWCON
Country/TerritoryUnited States
CityAtlanta, GA
Period19/09/0422/09/04

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