Abstract
In this study, a 50-nm Al0.05Ga0.95N back barrier (BB) layer was used in an AlGaN/GaN high-electron-mobility transistor between the two-dimensional electron gas channel and Fe-doped/C-doped buffer layers. This BB layer can reduce the channel layer. The BB layer is affected by doped carriers in the buffer layer and the conduction energy band between the channel and the buffer layers. The Ion/Ioffratio of the BB device was 3.43 × 105and the ratio for the device without BB was 1.91 × 103. Lower leakage currents were obtained in the BB device because of the higher conduction energy band. The 0.25-μm gate length device with the BB exhibited a high current gain cutoff frequency of 26.9 GHz and power gain cutoff frequency of 54.7 GHz.
Original language | English |
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Title of host publication | CS MANTECH 2020 - 2020 International Conference on Compound Semiconductor Manufacturing Technology, Digest of Papers |
Publisher | CS Mantech |
Pages | 183-186 |
Number of pages | 4 |
ISBN (Electronic) | 9781893580305 |
State | Published - 2020 |
Event | 2020 International Conference on Compound Semiconductor Manufacturing Technology, CS MANTECH 2020 - Tuczon, United States Duration: 11 05 2020 → 14 05 2020 |
Publication series
Name | CS MANTECH 2020 - 2020 International Conference on Compound Semiconductor Manufacturing Technology, Digest of Papers |
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Conference
Conference | 2020 International Conference on Compound Semiconductor Manufacturing Technology, CS MANTECH 2020 |
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Country/Territory | United States |
City | Tuczon |
Period | 11/05/20 → 14/05/20 |
Bibliographical note
Publisher Copyright:© CS MANTECH 2020 - 2020 International Conference on Compound Semiconductor Manufacturing Technology, Digest of Papers.
Keywords
- Back barrier (B.B.) layer
- Conduction band energy
- Current gain (f) and power gain (f)