The correlation between device aging and system degradation

Song Lan, Cher Ming Tan*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

An electronic system contains millions of components on a single chip today, and the failure of any of these components may lead to the system failure. Conventionally, the system reliability is ensured by having a high reliable subsystem or component, and thus efforts are placed to study the reliability of individual components in electronic system. However, the failure mechanisms of a system is lot more complex, and the correlation between the system failure and component failure is not straight forward, depending on the system configuration, as demonstrated in this work. Therefore, electronic system reliability may not be derived from its components' reliability.

Original languageEnglish
Title of host publicationTheory and Practice of Quality and Reliability Engineering in Asia Industry
PublisherSpringer Singapore
Pages249-259
Number of pages11
ISBN (Electronic)9789811032905
ISBN (Print)9789811032882
DOIs
StatePublished - 01 01 2017

Bibliographical note

Publisher Copyright:
© Springer Nature Singapore Pte Ltd. 2017. All rights are reserved.

Keywords

  • Component importance
  • Component reliability
  • Feedback
  • System configuration
  • System degradation

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