| Translated title of the contribution | 低電壓操作SONOS快閃式記憶元件之機制及可靠性研究 |
|---|---|
| Original language | American English |
| Supervisors/Advisors |
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| State | Published - 2007 |
| Externally published | Yes |
The Investigationof the Mechanism and Reliability for Low Voltage Operation SONOS Flash Memory Devices
曾元亨
Research output: Types of Thesis › Master's thesis