| Translated title of the contribution | 低電壓操作SONOS快閃式記憶元件之機制及可靠性研究 |
|---|---|
| Original language | American English |
| Supervisors/Advisors |
|
| State | Published - 2007 |
| Externally published | Yes |
Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver
The Investigationof the Mechanism and Reliability for Low Voltage Operation SONOS Flash Memory Devices
- 曾元亨
Research output: Types of Thesis › Master's thesis