| Translated title of the contribution | 鈦摻雜三氧化二鏑高介電絕緣層和65奈米電晶體特性及可靠度之研究 |
|---|---|
| Original language | American English |
| Supervisors/Advisors |
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| State | Published - 2011 |
| Externally published | Yes |
The Study of Ti-doped Dy2O3 High-k Dielectrics and 65 Nanometer Transistor Characteristics and Reliability
陳功劭
Research output: Types of Thesis › Master's thesis