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Thin silicon light-addressable potentiometric sensor by Deep reactive-ion etching

  • Wei Yin Zeng
  • , Tsung Cheng Chen
  • , Hui Ling Liu
  • , Yu Ping Chen
  • , Chia Ming Yang*
  • *Corresponding author for this work
  • Chang Gung University
  • Chang Gung Memorial Hospital

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

To have a high photocurrent and spatial resolution of 2-dimensional (2D) chemical image in light-addressable potentiometric sensor (LAPS), silicon substrate is thinned down to about 100 μm by Deep reactive-ion etching (DRIE). Compare to commercial Si substrate with thickness of 350 μm, photocurrent is increased for 4.5 times and operation frequency is increased to 20 kHz. pH sensitivity is 67.09 mV/pH for NbOx sensing membrane. A clear 2D image to recognize a pattern with width of 100 μm can be obtained. Higher signal to noise ratio is benefit for high-speed and spatial resolution of 2D chemical image.

Original languageEnglish
Title of host publicationTRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1540-1542
Number of pages3
ISBN (Electronic)9781538627310
DOIs
StatePublished - 26 07 2017
Event19th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2017 - Kaohsiung, Taiwan
Duration: 18 06 201722 06 2017

Publication series

NameTRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems

Conference

Conference19th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2017
Country/TerritoryTaiwan
CityKaohsiung
Period18/06/1722/06/17

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

Keywords

  • 2D
  • Chemical image
  • DRIE
  • LAPS
  • Si

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