Abstract
In this study, we perform a top gate field effect transistor by using the integration of novel materials such as graphene as active channel and fluorinated graphene as dielectrics on flexible Polyethylene terephthalate (PET) substrate. These device shows high carrier mobility (∼969 cm2/v.s) at a drain bias of +0.5V. It shows good mechanical flexibility and electrical stability after bending measurement under modest strain upto 15% with different bending cycles. This result reveals the benefits of using 2D material that is graphene and fluorinated graphene for flexible electronics devices.
Original language | English |
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Title of host publication | 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2017 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 1-4 |
Number of pages | 4 |
ISBN (Electronic) | 9781538617793 |
DOIs | |
State | Published - 05 10 2017 |
Event | 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2017 - Chengdu, China Duration: 04 07 2017 → 07 07 2017 |
Publication series
Name | Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA |
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Volume | 2017-July |
Conference
Conference | 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2017 |
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Country/Territory | China |
City | Chengdu |
Period | 04/07/17 → 07/07/17 |
Bibliographical note
Publisher Copyright:© 2017 IEEE.