Two-dimensional cell parameters measurement of a twisted nematic liquid crystal device by using imaging ellipsometer

Chih Jen Yu; Yao Teng Tseng; Kuei Chu Hsu; Chien Chou

doi:10.1117/12.907016

Two-dimensional cell parameters measurement of a twisted nematic liquid crystal device by using imaging ellipsometer

Chih Jen Yu^*
, Yao Teng Tseng
, Kuei Chu Hsu
, Chien Chou

^*Corresponding author for this work

Graduate Institute of Electro-Optical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

Based on the equivalence theorem of a unitary optical system. We proposed an analytical approach to characterize the cell parameters of a twisted nematic liquid crystal device (TNLCD) with full field resolution. The spatial distribution of three characteristic parameters of a TNLCD were measured by using a polarizer-sample-analyzer imaging ellipsometer, thus the untwisted phase retardation, cell thickness and twisted angle of a TNLCD can be directly calculated through the explicit expressions as a function of its characteristic parameters. The measured results are very close to the design values provided by TNLCD manufacture. This method shows that both the system setup and parameters calculating process are quite simple. It would be more helpful to characterize a TNLCD in the manufacturing process.

Original language	English
Title of host publication	Physics and Simulation of Optoelectronic Devices XX
DOIs	https://doi.org/10.1117/12.907016
State	Published - 2012
Event	Physics and Simulation of Optoelectronic Devices XX - San Francisco, CA, United States Duration: 23 01 2012 → 26 01 2012

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	8255
ISSN (Print)	0277-786X

Conference

Conference	Physics and Simulation of Optoelectronic Devices XX
Country/Territory	United States
City	San Francisco, CA
Period	23/01/12 → 26/01/12

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

Keywords

Birefringence
Imaging ellipsometer
Liquid crystal device

Access to Document

10.1117/12.907016

Cite this

@inproceedings{03296fb063c9496fbb671e6df559e4bc,

title = "Two-dimensional cell parameters measurement of a twisted nematic liquid crystal device by using imaging ellipsometer",

abstract = "Based on the equivalence theorem of a unitary optical system. We proposed an analytical approach to characterize the cell parameters of a twisted nematic liquid crystal device (TNLCD) with full field resolution. The spatial distribution of three characteristic parameters of a TNLCD were measured by using a polarizer-sample-analyzer imaging ellipsometer, thus the untwisted phase retardation, cell thickness and twisted angle of a TNLCD can be directly calculated through the explicit expressions as a function of its characteristic parameters. The measured results are very close to the design values provided by TNLCD manufacture. This method shows that both the system setup and parameters calculating process are quite simple. It would be more helpful to characterize a TNLCD in the manufacturing process.",

keywords = "Birefringence, Imaging ellipsometer, Liquid crystal device",

author = "Yu, \{Chih Jen\} and Tseng, \{Yao Teng\} and Hsu, \{Kuei Chu\} and Chien Chou",

year = "2012",

doi = "10.1117/12.907016",

language = "英语",

isbn = "9780819488985",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

booktitle = "Physics and Simulation of Optoelectronic Devices XX",

note = "Physics and Simulation of Optoelectronic Devices XX ; Conference date: 23-01-2012 Through 26-01-2012",

}

Yu, CJ, Tseng, YT, Hsu, KC & Chou, C 2012, Two-dimensional cell parameters measurement of a twisted nematic liquid crystal device by using imaging ellipsometer. in Physics and Simulation of Optoelectronic Devices XX., 82551T, Proceedings of SPIE - The International Society for Optical Engineering, vol. 8255, Physics and Simulation of Optoelectronic Devices XX, San Francisco, CA, United States, 23/01/12. https://doi.org/10.1117/12.907016

Two-dimensional cell parameters measurement of a twisted nematic liquid crystal device by using imaging ellipsometer. / Yu, Chih Jen; Tseng, Yao Teng; Hsu, Kuei Chu et al.
Physics and Simulation of Optoelectronic Devices XX. 2012. 82551T (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8255).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Two-dimensional cell parameters measurement of a twisted nematic liquid crystal device by using imaging ellipsometer

AU - Yu, Chih Jen

AU - Tseng, Yao Teng

AU - Hsu, Kuei Chu

AU - Chou, Chien

PY - 2012

Y1 - 2012

N2 - Based on the equivalence theorem of a unitary optical system. We proposed an analytical approach to characterize the cell parameters of a twisted nematic liquid crystal device (TNLCD) with full field resolution. The spatial distribution of three characteristic parameters of a TNLCD were measured by using a polarizer-sample-analyzer imaging ellipsometer, thus the untwisted phase retardation, cell thickness and twisted angle of a TNLCD can be directly calculated through the explicit expressions as a function of its characteristic parameters. The measured results are very close to the design values provided by TNLCD manufacture. This method shows that both the system setup and parameters calculating process are quite simple. It would be more helpful to characterize a TNLCD in the manufacturing process.

AB - Based on the equivalence theorem of a unitary optical system. We proposed an analytical approach to characterize the cell parameters of a twisted nematic liquid crystal device (TNLCD) with full field resolution. The spatial distribution of three characteristic parameters of a TNLCD were measured by using a polarizer-sample-analyzer imaging ellipsometer, thus the untwisted phase retardation, cell thickness and twisted angle of a TNLCD can be directly calculated through the explicit expressions as a function of its characteristic parameters. The measured results are very close to the design values provided by TNLCD manufacture. This method shows that both the system setup and parameters calculating process are quite simple. It would be more helpful to characterize a TNLCD in the manufacturing process.

KW - Birefringence

KW - Imaging ellipsometer

KW - Liquid crystal device

UR - https://www.scopus.com/pages/publications/84859949603

U2 - 10.1117/12.907016

DO - 10.1117/12.907016

M3 - 会议稿件

AN - SCOPUS:84859949603

SN - 9780819488985

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Physics and Simulation of Optoelectronic Devices XX

T2 - Physics and Simulation of Optoelectronic Devices XX

Y2 - 23 January 2012 through 26 January 2012

ER -

Two-dimensional cell parameters measurement of a twisted nematic liquid crystal device by using imaging ellipsometer

Abstract

Publication series

Conference

UN SDGs

Keywords

Access to Document

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