VHDL-based design and analysis of defect tolerant VLSI/WSI array architectures

Sy Yen Kuo*, Kuochen Wang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The authors present an integrated computer-aided design environment, the VAR (VHDL-based array reconfiguration) system, for the design, diagnosis, reconfiguration, simulation, and evaluation of an array architecture described in VHDL. VAR allows one to study fault diagnosis and reconfiguration algorithms by inserting user-defined faults into the array and then locating the faulty processing elements as well as simulating the actual reconfiguration process by mapping a target array onto a host array. Thus, VAR can assist the designer in evaluating different combinations of diagnosis algorithms, reconfiguration algorithms, and reconfigurable architectures.

Original languageEnglish
Title of host publication91 Int Conf Wafer Scale Integr
PublisherPubl by IEEE
Pages163-169
Number of pages7
ISBN (Print)0818691263
StatePublished - 1991
Externally publishedYes
Event1991 International Conference on Wafer Scale Integration - San Francisco, CA, USA
Duration: 29 01 199131 01 1991

Publication series

Name91 Int Conf Wafer Scale Integr

Conference

Conference1991 International Conference on Wafer Scale Integration
CitySan Francisco, CA, USA
Period29/01/9131/01/91

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