TY - GEN
T1 - VHDL-based design and analysis of defect tolerant VLSI/WSI array architectures
AU - Kuo, Sy Yen
AU - Wang, Kuochen
PY - 1991
Y1 - 1991
N2 - The authors present an integrated computer-aided design environment, the VAR (VHDL-based array reconfiguration) system, for the design, diagnosis, reconfiguration, simulation, and evaluation of an array architecture described in VHDL. VAR allows one to study fault diagnosis and reconfiguration algorithms by inserting user-defined faults into the array and then locating the faulty processing elements as well as simulating the actual reconfiguration process by mapping a target array onto a host array. Thus, VAR can assist the designer in evaluating different combinations of diagnosis algorithms, reconfiguration algorithms, and reconfigurable architectures.
AB - The authors present an integrated computer-aided design environment, the VAR (VHDL-based array reconfiguration) system, for the design, diagnosis, reconfiguration, simulation, and evaluation of an array architecture described in VHDL. VAR allows one to study fault diagnosis and reconfiguration algorithms by inserting user-defined faults into the array and then locating the faulty processing elements as well as simulating the actual reconfiguration process by mapping a target array onto a host array. Thus, VAR can assist the designer in evaluating different combinations of diagnosis algorithms, reconfiguration algorithms, and reconfigurable architectures.
UR - http://www.scopus.com/inward/record.url?scp=0025901416&partnerID=8YFLogxK
M3 - 会议稿件
AN - SCOPUS:0025901416
SN - 0818691263
T3 - 91 Int Conf Wafer Scale Integr
SP - 163
EP - 169
BT - 91 Int Conf Wafer Scale Integr
PB - Publ by IEEE
T2 - 1991 International Conference on Wafer Scale Integration
Y2 - 29 January 1991 through 31 January 1991
ER -