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Yellow-green InGaN-based light emitting diodes with emission peak wavelength red shifts under low injection current

  • Mu Jen Lai*
  • , Liann Be Chang
  • , Ray Ming Lin
  • , Ming Jer Jeng
  • *Corresponding author for this work
  • Chang Gung University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

We investigate the optical and electrical properties of the yellow-green InGaN-based light-emitting diode (LED) with a InGaN/GaN short-period superlattice and width-modulation quantum wells as the strain-accommodative layer. It is found that the peak wavelength shifts from 568.4 nm at 20 mA to 584.8 nm at 100 mA. The peak intensity of EL spectra doubles when the driving current increases from 20 to 60 mA and decreases to 1.7 times at a driving current of 100 mA. These results are attributed to the state-filling effect and the quantum confined Stark effect (QCSE) of the InGaN/GaN active region are effectively inhibited by inserting the strain-accommodative structure proposed in this work. The bandgap renormalization effect remarkably dominates the EL properties and the heat effect occurs at a driving current over 60 mA.

Original languageEnglish
Title of host publication9th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronics, MINO '10
Pages52-55
Number of pages4
StatePublished - 2010
Event9th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronics, MINO '10 - Catania, Italy
Duration: 29 05 201031 05 2010

Publication series

Name9th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronics, MINO '10

Conference

Conference9th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronics, MINO '10
Country/TerritoryItaly
CityCatania
Period29/05/1031/05/10

Keywords

  • Bandgap renormalization
  • Carrier localization
  • Electroluminescence
  • InGaN
  • Light-emitting diode
  • Red-shift

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