跳至主導覽
跳至搜尋
跳過主要內容
長庚大學學術能量集萃 首頁
說明與常見問題
English
中文
首頁
學者概覽
研究單位
研究產出
研究計畫-專案
獎項
活動
按專業知識、姓名或所屬機構搜尋
查看斯高帕斯 (Scopus) 概要
張 文珍
副教授
,
資訊管理學系(含學碩士班)
https://orcid.org/0000-0002-5950-0240
電子郵件
D000005497
cgu.edu
tw
h-index
h10-index
h5-index
463
引文
12
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
41
引文
4
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
25
引文
3
h-指數
按照存儲在普爾（Pure）的出版物數量及斯高帕斯（Scopus）引文計算。
2000
2024
每年研究產出
概覽
指紋
網絡
研究計畫-專案
(11)
研究產出
(38)
相近領域學者
(6)
指導學生論文
(5)
指紋
查看啟用 Wen-Jen Chang 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Medicine and Dentistry
Accuracy
33%
Adhesive Agent
19%
Amalgam
16%
Analysis
38%
Bone
34%
Cement
19%
CEREC
16%
Combination Therapy
16%
Computer-Aided Design
23%
Cortical Bone
19%
Dental Procedure
16%
Development
34%
Edentulism
16%
Element
50%
Endodontics
16%
Evaluation Study
81%
Factor Analysis
16%
Finite Element Analysis
61%
Fracture
10%
Hip Replacement
16%
Hybrid
16%
Implant
42%
In Vitro
34%
Inpatient
16%
Maxilla
16%
Measurement
16%
Oral Hygiene
25%
Oral Submucous Fibrosis
10%
Orthodontics
33%
Osteoplasty
18%
Osteoporosis
16%
Patient
36%
Patient Satisfaction
16%
Periodontitis
16%
Plastic
16%
Position
6%
Premolar
37%
Prosthesis
19%
Resin
33%
Retainer
16%
Salicylic Acid
23%
Screw
24%
Self Care
33%
Splinting
12%
Stress
63%
Suture Material
16%
Therapeutic Procedure
16%
Titanium
16%
Tooth
100%
Wing
13%
Engineering
Adhesive Interface
16%
Anchors
16%
Applications
10%
Bracket Base
16%
Cavity
16%
Ceramic Restoration
16%
Chains
16%
Characteristics
21%
Closed Loop
16%
Computer Aided Design
16%
Computer Aided Manufacturing
16%
Crack Depth
16%
Design
16%
Design Factor
15%
Determines
13%
Development
16%
Dimensional Printing
16%
Elements
76%
Endodontic Treatment
16%
Engineering Method
16%
Estimation
33%
Evaluation
37%
Failure (Mechanical)
16%
Failure Probability
11%
Finite Element Modeling
14%
Hybrid
20%
Implants
33%
Load Condition
11%
Longer Period
8%
Machining
16%
Mechanisms
11%
Models
25%
Multiple Criterion
16%
Orthodontic Bracket
16%
Pricing
16%
Products
16%
Prosthetics
16%
Quality Engineering
16%
Remanufacturing
16%
Semiconductor
16%
Shallower
11%
Surfaces
11%
Taguchi Method
42%
Temperature
16%
Testing
16%
Thickness
11%
Throughput
12%
Titanium
16%
Traction
10%
Validation
8%
