跳至主導覽 跳至搜尋 跳過主要內容

A 0.18μm probabilistic-based noise-tolerate circuit design and implementation with 28.7dB noise-immunity improvement

  • I. Chyn Wey*
  • , You Gang Chen
  • , Changhong Yu
  • , Jie Chen
  • , An Yen Wu
  • *此作品的通信作者
  • National Taiwan University
  • University of Alberta

研究成果: 會議稿件的類型論文同行評審

23 引文 斯高帕斯(Scopus)

摘要

As the size of CMOS devices is scaled down to the nanoscale level, noise interferences start to significantly affect the VLSI circuit performance. Because the injected noise is random and dynamic in nature, a probabilistic-based approach is more suitable to handle signal errors than the conventional deterministic circuit designs. In this paper, we design and implement an 8-bit Markov Random Field carry lookahead adder (MRF_CLA) probabilistic-based noise-tolerant circuit in 0.18μm CMOS process technology. This is the first working silicon design to prove the design concept of the noise-tolerant MRF circuits. The measurement results show that the proposed of the MRF adder can provide 28.7dB of noise-immunity as compared with its conventional CMOS design, when both circuits are facing the same server SNR environment. The MRF adder circuit can also achieve 10-6 BER when the supply voltage is only 0.45V and SNR is only 10dB.

原文英語
頁面291-294
頁數4
DOIs
出版狀態已出版 - 2006
對外發佈
事件2006 IEEE Asian Solid-State Circuits Conference, ASSCC 2006 - Hangzhou, 中國
持續時間: 13 11 200615 11 2006

Conference

Conference2006 IEEE Asian Solid-State Circuits Conference, ASSCC 2006
國家/地區中國
城市Hangzhou
期間13/11/0615/11/06

指紋

深入研究「A 0.18μm probabilistic-based noise-tolerate circuit design and implementation with 28.7dB noise-immunity improvement」主題。共同形成了獨特的指紋。

引用此