TY - GEN
T1 - A novel MRI-SPECT registration scheme using eight similarity measures
AU - Huang, Chung Hsien
AU - Lee, Jiann Der
AU - Weng, Yi Hsin
PY - 2006
Y1 - 2006
N2 - In this paper, we propose a novel image registration scheme for MRI/SPECT registration. First, MRI is decomposed into some different brain maps by fuzzy c-means algorithm. Then, Gaussian convolution is performed with the map represented gray and white matter to simulate the radiation phenomenon of SPECT. Finally, the MRI/SPECT registration is carried out by optimizing a similarity measure. Finally, the best transformation for registration is reached by Powell's direction set method. In order to determine the most appropriate similarity measure, eight similarity measures are evaluated by performing the proposed registration scheme. The results show that Pattern Intensity has best results, and Mean Square Difference of Intensities is the worst.
AB - In this paper, we propose a novel image registration scheme for MRI/SPECT registration. First, MRI is decomposed into some different brain maps by fuzzy c-means algorithm. Then, Gaussian convolution is performed with the map represented gray and white matter to simulate the radiation phenomenon of SPECT. Finally, the MRI/SPECT registration is carried out by optimizing a similarity measure. Finally, the best transformation for registration is reached by Powell's direction set method. In order to determine the most appropriate similarity measure, eight similarity measures are evaluated by performing the proposed registration scheme. The results show that Pattern Intensity has best results, and Mean Square Difference of Intensities is the worst.
UR - http://www.scopus.com/inward/record.url?scp=50249109091&partnerID=8YFLogxK
U2 - 10.1109/IECON.2006.348113
DO - 10.1109/IECON.2006.348113
M3 - 会议稿件
AN - SCOPUS:50249109091
SN - 1424401364
SN - 9781424401369
T3 - IECON Proceedings (Industrial Electronics Conference)
SP - 3492
EP - 3495
BT - IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics
T2 - IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics
Y2 - 6 November 2006 through 10 November 2006
ER -