AlGaN/GaN Schottky barrier diodes on silicon substrates with various Fe doping concentrations in the buffer layers

Hsien Chin Chiu, Shang Cyun Chen, Jiun Wei Chiu, Bo Hong Li, Hou Yu Wang, Li Yi Peng, Hsiang Chun Wang, Kuang Po Hsueh*

*此作品的通信作者

研究成果: 期刊稿件文章同行評審

9 引文 斯高帕斯(Scopus)

摘要

This study demonstrated AlGaN/GaN Schottky barrier diodes (SBDs) for use in high-frequency, high-power, and high-temperature electronics applications. Four structures with various Fe doping concentrations in the buffer layers were investigated to suppress the leakage current and improve the breakdown voltage. The fabricated SBD with an Fe-doped AlGaN buffer layer of 8 × 1017 cm− 3 realized the highest on-resistance (RON) and turn-on voltage (VON) because of the memory effect of Fe diffusion. The optimal device was the SBD with an Fe-doped buffer layer of 7 × 1017 cm− 3, which exhibited a RON of 31.6 mΩ-cm2, a VON of 1.2 V, a breakdown voltage of 803 V, and a buffer breakdown voltage of 758 V. Additionally, the low-frequency noise decreased when the Fe doping concentration in the buffer layer was increased. This was because the electron density in the channel exhibited the same trend as that of the Fe doping concentration in the buffer layer.

原文英語
頁(從 - 到)238-241
頁數4
期刊Microelectronics Reliability
83
DOIs
出版狀態已出版 - 04 2018

文獻附註

Publisher Copyright:
© 2017 Elsevier Ltd

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