An efficient perfect algorithm for memory repair problems

Hung Yau Lin*, Fu Min Yeh, Ing Yi Chen, Sy Yen Kuo

*此作品的通信作者

研究成果: 圖書/報告稿件的類型會議稿件同行評審

8 引文 斯高帕斯(Scopus)

摘要

Memory repair by using spare rows/columns to replace faulty rows/columns has been proved to be NP-complete. Traditional perfect algorithms are comparison-based exhaustive search algorithms and are not efficient enough for complex problems. To overcome the deficiency of performance, a new algorithm has been devised and presented in this paper. The algorithm transforms a memory repair problem into Boolean function operations. By using BDD (Binary Decision Diagram) to manipulate Boolean functions, a repair function which encodes all repair solutions of a memory repair problem can be constructed. The optimal solution, if it exists, can be found efficiently by traversing the BDD of a repair function only once. The algorithm is very efficient due to the fact that BDD can remove redundant nodes, combine isomorphic subgraphs together, and have very compact representations of Boolean functions if a good variable ordering is chosen. The remarkable performance of the algorithm can be demonstrated by experimental results. Because a memory repair problem can be modeled as a bipartite graph, the algorithm may be useful for researchers in other fields such as graph theory.

原文英語
主出版物標題Proceedings - 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
編輯R. Aitken, A. Salsano, R. Velazco, X. Sun
頁面306-313
頁數8
DOIs
出版狀態已出版 - 2004
對外發佈
事件19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Cannes, 法國
持續時間: 10 10 200413 10 2004

出版系列

名字IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
ISSN(列印)1550-5774

Conference

Conference19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
國家/地區法國
城市Cannes
期間10/10/0413/10/04

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