Capacitance characteristics and breakdown mechanism of Algan/Gan metal-semiconductor-metal varactors and their anti-surge application

Chien Fu Shih, Yu Li Hsieh, Liann Be Chang*, Ming Jer Jeng, Zi Xin Ding, Shao An Huang

*此作品的通信作者

研究成果: 期刊稿件文章同行評審

2 引文 斯高帕斯(Scopus)

摘要

The AlGaN/GaN materials with a wide band gap, high electron mobility, and high breakdown voltage are suitable for manufacturing high-power and high-frequency electronic devices. In this study, metal Schottky contact electrodes of different dimensions are prepared on AlGaN/GaN wafers to fabricate metal-semiconductor-metal (MSM) varactors. Voltage-dependent capacitance and breakdown voltages of the varactors are measured and studied. The corresponding breakdown mechanisms of varactors with different electrode gaps are proposed. Furthermore, an anti-surge application using GaN-based MSM varactors in a signal transmission module is demonstrated, and its surge suppression capability is shown. We believe that our study will be beneficial in developing surge protection circuits for RF applications.

原文英語
文章編號292
期刊Crystals
10
發行號4
DOIs
出版狀態已出版 - 04 2020

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© 2020 by the authors. Licensee MDPI, Basel, Switzerland.

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