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Characterization of BaPbO3 and Ba(Pb1-xBix)O3 thin films

  • Chia Liang Sun
  • , Hong Wen Wang*
  • , Ming Chu Chang
  • , Meng Suan Lin
  • , San Yuan Chen
  • *此作品的通信作者
  • National Yang Ming Chiao Tung University
  • Chung Yuan Christian University
  • National Tsing Hua University

研究成果: 期刊稿件文章同行評審

13 引文 斯高帕斯(Scopus)

摘要

BaPbO3 and Ba(Pb1-xBix)O3 films made from barium 2-ethylhexanoate, lead 2-ethylhexanoate and bismuth acetate were prepared by metal-organic deposition (MOD) method on Pt/Ti/SiO2/Si substrate. The phase transition and the physical properties of these films were studied. The polycrystalline BaPbO3 phase starts to form above 600 °C and the Pb-excess addition would enhance the formation of single perovskite BaPbO3 phase. With increasing annealing temperature, the optimum sheet resistance 1.6 Ω sq-1 (resistivity ≈ 1.07 × 10-4 Ω cm) could be obtained at 750 °C. However, an annealing temperature over 800 °C causes reactions between substrate and BaPbO3 phase and results in sharp increase of resistance. On the other hand, the substitution of Pb by Bi in the Ba(Pb1-xBix)O3 films could stabilize the perovskite phase, though the sheet resistance is raised over 10 Ω sq-1 at x = 0.3.

原文英語
頁(從 - 到)507-511
頁數5
期刊Materials Chemistry and Physics
78
發行號2
DOIs
出版狀態已出版 - 17 02 2003
對外發佈

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