Characterization of fractal surfaces

Jiunn Jong Wu

doi:10.1016/S0043-1648(99)00362-2

Characterization of fractal surfaces

Jiunn Jong Wu^*

^*此作品的通信作者

Chinese Culture University

研究成果: 期刊稿件 › 文章 › 同行評審

103 引文斯高帕斯（Scopus）

摘要

Fractal profiles are generated and analyzed. It is found that the root mean square (rms) slope and curvature can be obtained from the structure function. Also, it is found that rms curvature is a good estimate of asperity curvature. Finally, a bifractal surface is analyzed. It is found that the critical wave number of the spectral density does not correspond to the critical length of the structure function. Again, the rms curvature is a good estimate for the asperity curvature of bifractal surfaces. (C) 2000 Elsevier Science S.A. All rights reserved.

原文	英語
頁（從 - 到）	36-47
頁數	12
期刊	Wear
卷	239
發行號	1
DOIs	https://doi.org/10.1016/S0043-1648(99)00362-2
出版狀態	已出版 - 04 2000
對外發佈	是

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title = "Characterization of fractal surfaces",

abstract = "Fractal profiles are generated and analyzed. It is found that the root mean square (rms) slope and curvature can be obtained from the structure function. Also, it is found that rms curvature is a good estimate of asperity curvature. Finally, a bifractal surface is analyzed. It is found that the critical wave number of the spectral density does not correspond to the critical length of the structure function. Again, the rms curvature is a good estimate for the asperity curvature of bifractal surfaces. (C) 2000 Elsevier Science S.A. All rights reserved.",

keywords = "Asperity, Fractal surface, Root mean square",

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N2 - Fractal profiles are generated and analyzed. It is found that the root mean square (rms) slope and curvature can be obtained from the structure function. Also, it is found that rms curvature is a good estimate of asperity curvature. Finally, a bifractal surface is analyzed. It is found that the critical wave number of the spectral density does not correspond to the critical length of the structure function. Again, the rms curvature is a good estimate for the asperity curvature of bifractal surfaces. (C) 2000 Elsevier Science S.A. All rights reserved.

AB - Fractal profiles are generated and analyzed. It is found that the root mean square (rms) slope and curvature can be obtained from the structure function. Also, it is found that rms curvature is a good estimate of asperity curvature. Finally, a bifractal surface is analyzed. It is found that the critical wave number of the spectral density does not correspond to the critical length of the structure function. Again, the rms curvature is a good estimate for the asperity curvature of bifractal surfaces. (C) 2000 Elsevier Science S.A. All rights reserved.

KW - Asperity

KW - Fractal surface

KW - Root mean square

UR - https://www.scopus.com/pages/publications/0034039677

U2 - 10.1016/S0043-1648(99)00362-2

DO - 10.1016/S0043-1648(99)00362-2

M3 - 文章

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SN - 0043-1648

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SP - 36

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Characterization of fractal surfaces

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