Constraint generation for software-based post-silicon bug masking with scalable resynthesis technique for constraint optimization

Chia Wei Chang*, Hong Zu Chou, Kai Hui Chang, Jie Hong Roland Jiang, Chien Nan Jimmy Liu, Chiu Han Hsiao, Sy Yen Kuo

*此作品的通信作者

研究成果: 圖書/報告稿件的類型會議稿件同行評審

3 引文 斯高帕斯(Scopus)

摘要

Due to the dramatic increase in design complexity, verifying the functional correctness of a circuit is becoming more difficult. Therefore, bugs may escape all verification efforts and be detected after tape-out. While most existing solutions focus on fixing the problem on the hardware, in this work we propose a different methodology that tries to generate constraints which can be used to mask the bugs using software. This is achieved by utilizing formal reachability analysis to extract the conditions that can trigger the bugs. By synthesizing the bug conditions, we can derive input constraints for the software so that the hardware bugs will never be exposed. In addition, we observe that such constraints have special characteristics: they have small onset terms and flexible minterms. To facilitate the use of our methodology, we also propose a novel resynthesis technique to reduce the complexity of the constraints. In this way, software can be modified to run correctly on the buggy hardware, which can improve system quality without the high cost of respin.

原文英語
主出版物標題Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011
頁面174-181
頁數8
DOIs
出版狀態已出版 - 2011
對外發佈
事件12th International Symposium on Quality Electronic Design, ISQED 2011 - Santa Clara, CA, 美國
持續時間: 14 03 201116 03 2011

出版系列

名字Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011

Conference

Conference12th International Symposium on Quality Electronic Design, ISQED 2011
國家/地區美國
城市Santa Clara, CA
期間14/03/1116/03/11

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