Correlating the Density of Trap-States and the Field-Effect Performance in Metal-Oxide Thin-Film Transistors with High-κ Gate Dielectrics via a Trap-Limited Conduction Method
Mochamad Januar, Chun Wen Cheng, Wen Kai Lin, Vito Vito, Meng Chyi Wu, Shu Tong Chang, Kou Chen Liu*
*此作品的通信作者
研究成果: 期刊稿件 › 文章 › 同行評審
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斯高帕斯(Scopus)