@inproceedings{7aaaf87e5ee04f2faf514d3a645efe98,
title = "Dynamic negative bias temperature instability in low-temperature poly-Si thin-film transistors",
abstract = "Dynamic negative bias temperature instability in p-channel low-temperature poly-Si thin-film transistors was studied in this paper. The degradation of the devices was found to be voltage and temperature dependent. In addition, the frequency and duty ratio of the gate pulse affects the degree of the device degradation. The mechanism of the device degradation was investigated, and a physical model is proposed to explain the mechanism.",
keywords = "Dynamic negative bias temperature instability, Thin-film transistor",
author = "Chen, \{Chih Yang\} and Wang, \{Tong Yi\} and Ma, \{Ming Wen\} and Chen, \{Wei Cheng\} and Lin, \{Hsiao Yi\} and Yeh, \{Kuan Lin\} and Wang, \{Shen De\} and Lei, \{Tan Fu\}",
year = "2007",
language = "英语",
isbn = "9787561752289",
series = "AD'07 - Proceedings of Asia Display 2007",
pages = "1233--1237",
booktitle = "AD'07 - Proceedings of Asia Display 2007",
note = "Asia Display 2007, AD'07 ; Conference date: 12-03-2007 Through 16-03-2007",
}