Edge spontaneous emission from 850 nm vertical-cavity surface emitting lasers

N. C. Chen*, C. Y. Lu, J. W. Chien, S. W. Chiu

*此作品的通信作者

研究成果: 期刊稿件文章同行評審

3 引文 斯高帕斯(Scopus)

摘要

The edge emission from 850 nm vertical-cavity surface emitting lasers has a much larger linewidth and a larger redshift coefficient than the surface emission. These differences explain why the threshold current increased asymmetrically when temperature deviated from the temperature associated with the lowest threshold current. The gradient of the edge intensity-current (L-I) curve declined when current exceeded the threshold value. This decline indicates the competition between stimulated emission and other mechanisms for recombining carriers. Thus, the optimal lasing power can be derived from the edge L-I curve, and the deviation from the measured value is the sum of unwanted optical loss.

原文英語
頁(從 - 到)2449-2452
頁數4
期刊Optics and Laser Technology
44
發行號8
DOIs
出版狀態已出版 - 11 2012

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