@inproceedings{3c4b1afe4d704c8c8913f537155000f2,
title = "Estimating the detection stability of a Si nanowire sensor using an additional charging electrode",
abstract = "This paper proposes a sensing stability estimation method that involves using an additional forcing electrode to simulate the surface charge coupling effect for bottom gate nanowire sensors. The alteration of the Si nanowire can be observed by using the charging electrode without any complex surface treatment and micro-channel setup. The nanowire sensor has a distinct charge-sensitive slope (Vth shift > 60 mV/10-16C) with a wire-width scaling of 35 nm. The proposed estimation technique simplifies the charge sensing operation.",
keywords = "Charge coupling effect, dection stability, nanosensor fabrication, nanowire FET, semiconductive sensors",
author = "Chen, {Min Cheng} and Chen, {Hsiao Chien} and Lee, {Ta Hsien} and Lin, {Yu Hsien} and Shih, {Jyun Hung} and Wang, {Bo Wei} and Hou, {Yun Fang} and Chen, {Yi Ju} and Lin, {Chia Yi} and Lin, {Chang Hsien} and Hsieh, {Yi Ping} and Ho, {Chia Hua} and Hua, {Mu Yi} and Qiu, {Jian Tai} and Tahui Wang and Yang, {Fu Liang}",
year = "2013",
doi = "10.1109/IRPS.2013.6532089",
language = "英语",
isbn = "9781479901135",
series = "IEEE International Reliability Physics Symposium Proceedings",
pages = "ME.1.1--ME.1.4",
booktitle = "2013 IEEE International Reliability Physics Symposium, IRPS 2013",
note = "2013 IEEE International Reliability Physics Symposium, IRPS 2013 ; Conference date: 14-04-2013 Through 18-04-2013",
}