摘要
Based on the equivalence theorem of a unitary optical system, we proposed an analytical approach to characterize the cell parameters of a twisted nematic liquid-crystal device (TNLCD) with full-field resolution. The spatial distribution of three characteristic parameters of a TNLCD was measured by using a polarizer-sample-analyzer imaging polarimeter so that the untwisted phase retardation, cell thickness, and twisted angle of a TNLCD can be directly calculated through the explicit expressions as a function of the characteristic parameters. The measured results agree well with the given values. This method can be implemented for characterization of a TNLCD in the manufacturing process.
原文 | 英語 |
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頁(從 - 到) | 238-244 |
頁數 | 7 |
期刊 | Applied Optics |
卷 | 51 |
發行號 | 2 |
DOIs | |
出版狀態 | 已出版 - 10 01 2012 |