摘要
A GaN-based metal–semiconductor–metal varactor with a two-dimensional electron gas (2DEG) layer is proposed and fabricated. The capacitance variation of this fabricated varactor biased at different external voltages is studied and measured, and the frequency-dependent capacitance and resistance of the varactor are simulated by a corresponding empirical formula. A high-frequency protective filter is further constructed and placed under a large pulsed-current injection in a malicious electromagnetic interference immunity test. The results show that the proposed GaN-based module can reduce the large pulsed current to an acceptably small level. Thus, the GaN-based 2DEG varactor is an attractive candidate for applications designed to protect the upcoming 5G high-frequency system from risks such as electrostatic discharge, lightning, and electromagnetic pulses.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | 6798-6805 |
| 頁數 | 8 |
| 期刊 | Journal of Electronic Materials |
| 卷 | 49 |
| 發行號 | 11 |
| DOIs | |
| 出版狀態 | 已出版 - 01 11 2020 |
文獻附註
Publisher Copyright:© 2020, The Author(s).
指紋
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